基本解释：射电光谱仪
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The assessing of the measuring uncertainty for analyzing with the photoelectric emission spectrograph;光电发射光谱仪分析测量不确定度的评定
Ion beam induced structural and compositional modifications were studied by means of X-ray diffractometer (XRD) and X-ray photoelectron spectroscopy (XPS) techniques.用 35MeV u的Ar离子室温下辐照多层堆叠的半晶质的聚酯 (PET)膜 ,采用X射线衍射技术和X射线光电子谱仪分析研究了辐照引起的表面结构和组分的变化。
On the basis of measuring temperature in grinding arc-zone, a study on the compositionsand structures of oxide films on both normal creep feed grinding and different burnt colour bymeans of X-ray photoelectron spectroscopy.本实验应用X射线光电子谱仪,在获取磨削弧区温度的基础上研究了K 417镍基铸造高温合金表面氧化膜的成分和结构,其中包括正常缓磨后及出现不同层次烧伤色后的氧化膜,结果表明,氧化膜不是出现烧伤色的试样所特有,对正常缓磨试样也存在,只是氧化膜厚度不同而已。
The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with X-ray photoelectron spectroscopy (XPS).本文应用XPS(X射线光电子能谱仪)研究了真空烘烤对碘化铯光阴极化学状态的影响。
X-ray photoelectron spectroscopy(XPS) was used to measure the variation of composition in different thickness of film,and ellipometry was used to fit the experimental result of the XPS.用X射线光电子能谱仪(XPS)测量了薄膜的成分随深度方向的变化,用反射式椭偏仪对X射线光电子能谱仪测得的实验结果进行模拟与验证。
X-ray photo-electron spectrometer (XPS)X射线光电子能谱仪
X-ray photo electron spectroscopy (XPS)X射线光电子能谱法
The Charge Compensation in Analysis of CeO_2 in X-ray Photoelectron SpectroscopyCeO_2 X射线光电子能谱的电荷补偿分析
X-ray fluorescent emission spectrometerX射线荧光发射光谱仪
nondiffraction X-ray spectrometer非衍射x射线光谱仪
Combined Analysis of Urinary Stones by X-ray Photoelectron Spectroscopy and X-ray Powder Diffraction泌尿系结石的X射线光电子能谱和X射线衍射联合分析
four crystal X-ray spectrometer四晶体x射线光谱仪
X-ray absorption spectrometerX射线吸收式光谱仪
multiple crystal X-ray spectrometer多晶体x射线光谱仪
energy dispersive X-ray spectrometer能量扩散X射线谱仪
X-ray energy dispersive spectrometrx-射线能量分散谱仪
X-Ray Photoelectron Spectroscopic Analysis of Celluloses with Different Crystallization Index不同结晶指数纤维素的X射线光电子能谱分析
X-ray Photoelectron Spectroscopy Analysis of α-CN_x Films非晶碳氮薄膜的X射线光电子能谱研究
X-ray photoelectron spectroscopic studies on passivation films on zinc plating coatings formed by trivalent chromium passivating agents镀锌三价铬钝化膜的X射线光电子能谱研究
The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments.扫描电子显微镜能利用x射线谱仪的附件来提供化学组份的信息。
Application of Scanning Electron Microscope and X-ray Energy Dispersy Spectrum on Judicial Evidence扫描电子显微镜-X射线能谱仪在司法鉴定中的应用研究
nondispersive soft X-ray flourescence spectrometer非色散软X射线荧光光谱仪
wavelength dispersive X-ray fluorescence spectrometer波长色散X射线荧光光谱仪
