基本解释：干涉量度法
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VLBI (very long baseline interferometry)甚长底线干涉量度法
Technology Research of Gauge Block Length Measurement Based on Interferometry;基于干涉法的量块长度测量技术研究
Phase-shifting interferometry to the flatness of a compact disk光盘基片平整度的相移干涉测量方法
Fabry-Perot interferometry法布里－珀罗干涉测量法
millimetre-wavelength interferometry毫米波长干涉量度学
multiple exposure interferometry多次曝光干涉量度学
interferometry by holography全息照相干涉量度学
Measuring thickness of epitaxial layers of gallium arsenide by infrared interferenceGB/T8758-1988砷化镓外延层厚度红外干涉测量方法
Measurement of Refractive Index Using Minimum Visibility of Sodium Light Fringes by Michelson Interferometer迈氏干涉仪钠光条纹最小可见度法测量折射率
A Multi-Wavelengths Interferometry Applied in Nanometer Scale Measurement;多波长干涉法在纳米尺度测量中的应用
A Study on Acoustic Impedance Matching Criteria for Coating Thickness Measurement by Ultrasonic Interferometry超声干涉法涂层厚度测量声阻抗匹配判据研究
Method of Measuring Roundness Error Base on Electronic Speckle Pattern Interferometry基于电子散斑干涉的圆度误差测量方法研究
Deflection Measurement of Co-alloy Materials by Moiré Interferometry用云纹干涉法测量和研究双层钴合金的挠度
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry基于白光干涉的光学薄膜物理厚度测量方法
Method of measuring roundness error based on ESPI基于电子散斑干涉技术的圆度误差测量方法
The Common Optical Path Radial Shearing Interferometry to Measure 3-D Temperature Field共光路径向剪切干涉法测量三维温度场
Measurement of the temperature coefficient of maximal birefringent index of crystal by polarized interference spectrum测量晶体最大双折射率温度系数的偏光干涉法
Measuring thin-film thickness with phase-shift interferometry基于相位偏移干涉术的薄膜厚度测量方法
